Journal of Nanomaterials & Molecular NanotechnologyISSN: 2324-8777

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Characteristics of Dielectric Dispersion in Epoxy/Polyhedral Oligomeric Silsequioxane Nanocomposites

Characteristics of Dielectric Dispersion in Epoxy/Polyhedral Oligomeric Silsequioxane Nanocomposites

Multiple-arc analysis is used in conjunction with a generalized relaxation time distribution (GRTD) to derive dielectric constant, dielectric loss and a.c conductivity relations as function of frequency for epoxy/ polyhedral oligomericsilsequioxane (POSS) nanocomposites. The validity of this methodology is examined by comparing reported measurements with those calculated from relations obtained. The values are shown to agree satisfactorily over the frequency range 100kHz to 1000kHz.
 

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