Journal of Nanomaterials & Molecular NanotechnologyISSN: 2324-8777

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Research Article, J Nanomater Mol Nanotechnol Vol: 3 Issue: 2

Characteristics of Dielectric Dispersion in Epoxy/Polyhedral Oligomeric Silsequioxane Nanocomposites

Eed H1* and Zihlif AM2
1Basic Science Department, Applied Science Private University, Jordan
2Physics Department, the University of Jordan, Amman, Jordan
Corresponding author : Dr. Eed H
Basic Science Department, Applied Science Private University, Jordan
E-mail: eed.hussam@yahoo.com
Received: January 27, 2014 Accepted: March 13, 2014 Published: March 17, 2014
Citation: Eed H, Zihlif AM (2014) Characteristics of Dielectric Dispersion in Epoxy/Polyhedral Oligomeric Silsequioxane Nanocomposites. J Nanomater Mol Nanotechnol 3:2. doi:10.4172/2324-8777.1000144

Abstract

Characteristics of Dielectric Dispersion in Epoxy/Polyhedral Oligomeric Silsequioxane Nanocomposites

Multiple-arc analysis is used in conjunction with a generalized relaxation time distribution (GRTD) to derive dielectric constant, dielectric loss and a.c conductivity relations as function of frequency for epoxy/ polyhedral oligomericsilsequioxane (POSS) nanocomposites. The validity of this methodology is examined by comparing reported measurements with those calculated from relations obtained. The values are shown to agree satisfactorily over the frequency range 100kHz to 1000kHz.
 

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